Patterning microfluidic device wettability using flow confinement

Citation:

Abate, A. R. ; Thiele, J. ; Weinhart, M. ; Weitz, D. A. Patterning microfluidic device wettability using flow confinement. Lab on a Chip 2010, 10, 1774-1776. Copy at http://www.tinyurl.com/y4je8khv
abate2010.pdf214 KB

Abstract:

We present a simple method to spatially pattern the surface properties of microfluidic devices using flow confinement. Our technique allows surface patterning with micron-scale resolution. To demonstrate its effectiveness, we use it to pattern wettability to form W/O/W and O/W/O double emulsions.

Publisher's Version

Last updated on 04/01/2021